Climate∞

In Situ TEM platform with simultaneous heating and biasing in a controlled gas atmosphere

The Climate gas & heating solution enables dynamic studies of cyclic specimen transformations in gaseous environments at elevated temperatures and sub-Angstrom level.

Key Features
- Simultaneous application of electrical and thermal stimuli
- Easily switch between STEM and TEM modes
- Universal tip - Can be transferred to other TEM holders
- New infinity holder also enables liquid studies - Modular design
- Continuous real-time control - Temperature, voltage, pressure, flow, gas composition
- The most stable system available - In terms of image drift after a change in gas/heating/pressure parameters
- EDX compatible tip - Option for the highest possible resolution

Vaporizer

The Climate G+ Vaporizer now allows you to better replicate actual service conditions by controlling water vapour content within the reaction chamber inside your TEM. Ideally suited to in situ sties involving catalysis, nanomaterial growth and corrosion.

Independently control water vapour pressure (0 to 25 mbar) to produce an environment that more closely represents real world operating conditions by adding water vapour to your own tailored mix of 3 other gases, with control over:
- Pressure
- Flow rate
- Temperature
For more details download the product datasheet.

Climate – Gas and Heating TEM Platform

See what gas into the Climate TEM platform and how it all fits together.

Real-Time Catalyst Observations Using In Situ TEM

Real time observation of catalyst behaviour using in situ TEM

All
AFM/SPM/SNOM
CL
CLEM
Computed Tomography
Diffraction Imaging
EBSD
EDS
Electron Beam Lithography (EBL)
Electron Microscopy
Fabrication
FIB
In situ
Micro XRF
Microscopy
SEM
TEM
Thermal Probe Lithography
WDS
X-ray Imaging
X-ray Microscopy

Lightning Arctic – In situ TEM Solution with Cooling/Heating and Biasing

In situ

In Situ TEM Cooling, Biasing & Heating for your TEM

ExoSEM - Ex Situ Bench for Thermo-Mechanical Testing

In situ

360° viewing during a thermal or thermomechanical test outside your SEM

FurnaSEM - in situ SEM Furnace

In situ

In Situ SEM furnace ideal for high temperature studies up to 1300°C. perform dynamic studies inside your SEM or under an optical microscope.

MT 1000 Tensile/Compression Stage

In situ

The most precise and functional thermo-mechanical testing system on the market

TESCAN TENSOR - 4D STEM

TEM

A STEM that is as easy to use as a SEM

Model 1062 TrionMill

Electron MicroscopySEMTEM

Model 1062 TrionMill is an excellent tool for creating the sample surface characteristics needed for SEM imaging and analyses at shortest possible time and largest possible size.

Celeritas

TEM

A revolutionary new direct detection camera for four-dimensional scanning transmission electron microscopy (4D STEM) delivering more speed, more pixels and exceptional image quality.

Apollo

Diffraction ImagingElectron MicroscopyTEM

The world’s first event-based camera for high-throughput cryo-EM with no compromise in the QE and speed

TESCAN VEGA Compact

CLCLEMEBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyIn situMicro XRFSEMWDS

Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.

Model 2560 Vacuum Transfer Tomography Holder

Electron MicroscopyIn situTEM

An ideal platform to protect environmentally sensitive material during transfer to TEM’s

FIB Stub 3.0

In situ

Prepare lamellae directly on your Nano-chip inside your FIB

TESCAN SOLARIS X - Xe Plasma FIB-SEM for Semiconductors

EBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyFabricationFIBMicroscopySEMTEMWDS

Xe plasma FIB-SEM for Semiconductors

TESCAN DynaTOM

Computed TomographyIn situX-ray ImagingX-ray Microscopy

A dedicated 4D X-ray imaging

Model 2550 Cryo Transfer Tomography Holder

Electron MicroscopyIn situTEM

Cryo transfer and tomography of thin-film frozen-hydrated/vitrified specimens for low dose imaging and analysis

Model 1070 NanoClean

Electron MicroscopySEMTEM

Cleans specimens and holders immediately before insertion into an electron microscope; removes existing carbonaceous debris from the specimen and prevents contamination during imaging and analysis

Model 1051 TEM Mill

Diffraction ImagingFIBTEM

Table top precision preparation for producing high quality TEM samples for a wide variety of applications

Model 1080 PicoMill

Diffraction ImagingFIBTEM

The FIB is highly effective in preparing TEM specimens, but the use of a high-energy, liquid metal ion source can often result in specimen amorphization, gallium implantation, or both. Let the FIB do what the FIB does best; let the PicoMill system do the rest

Heating Module

In situSEM

A stable heating module capable of temperatures up to 1500°C for a range of in situ SEM studies with gas capable micro-environments enabled

Cryo Module 80 Kelvin

Electron MicroscopyFIBIn situSEM

An extremely low vibration level cryo module that runs on liquid nitrogen, adding new capabilities to your SEM

SEM Peltier Module

In situSEM

With rapid temperature changes and precise control using a PID-controller, combined with quick lock connectors for fast turn around, makes this the perfect peltier stage

SEM Add-on Tools

In situSEM

Ingenious add-on tools for in situ experimentation that brings new capabilities to your SEM

Transfer Module

Electron MicroscopyFIBIn situSEM

Made for the purpose of carrying delicate and sensitive specimens in a capsule from the SEM into a glove box, or vice versa, to ensure they are protected from air or moisture at all times.

Bending Module

In situSEM

World leading in situ materials testing of bending characteristics using your SEM

DE-64

Diffraction ImagingElectron MicroscopyTEM

Ideal for cryo-EM of very large viruses or cellular tomography. The DE-64 delivers user-adjustable full-frame streaming at up to 46 frames per second and offers unparalleled performance for electron counting.

DE-16

Diffraction ImagingElectron MicroscopyTEM

The DE-16 features the 10th generation of our revolutionary Direct Detection Device (DDD®) sensor, delivering industry-leading resolution and flexible, seamless viewing on a 4k x 4k field-of-view. The DE-16 is our most versatile direct detection TEM camera that enables TEM experiments not previously possible on a direct detector.

DE-DirectView

Diffraction ImagingElectron MicroscopyTEM

Excellent upgrade option for your existing TEM offering low dose imaging, electron counting and 4D STEM

TESCAN MIRA

CLCLEMEBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyIn situMicro XRFSEMWDS

Versatile and powerful FEG SEM

TESCAN CoreTOM

Computed TomographyIn situX-ray ImagingX-ray Microscopy

Multiscale 3D core imaging

TESCAN UniTOM XL

Computed TomographyIn situX-ray ImagingX-ray Microscopy

A unique alternative in Dynamic 3D X-ray imaging for your lab

Model 1040 NanoMill

Diffraction ImagingElectron MicroscopyFIBTEM

The NanoMill system is the ultimate companion for your FIB to optimise TEM specimen preparation quality

TESCAN VEGA

CLCLEMEBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyIn situMicro XRFSEMWDS

Analytical SEM for materials science and life science applications in research and industry

TESCAN AMBER 2 - Ga FIB-SEM

EBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyFabricationFIBIn situMicroscopySEMTEMThermal Probe Lithography

The most versatile and universal analytical Ga FIB-SEM platform on the market

TESCAN AMBER X 2 - Plasma FIB-SEM

EBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyFabricationFIBIn situMicroscopySEMTEMThermal Probe Lithography

Combining the speed of a plasma FIB with the resolution of a Ga FIB

MM3E Micromanipulator

Electron MicroscopyFIBIn situSEM

Adding capabilities from in situ lift-out, electrical probing (FA)and nano-manipulation, the encoded MM3E micro-manipulator brings new functionality to your SEM or FIB/SEM instrument

Tensile/Compression Module

EBSDEDSIn situSEM

World leading in situ materials testing of tensile and compression characteristics using your SEM

SuperFlat AFM

AFM/SPM/SNOMIn situSEM

The combination of Atomic Force Microscopy (AFM) and Scanning Electron Microscopes (SEM) opens the possibility of combining information on lateral dimensions and material from SEM inspection that can be readily complemented by precise topographical and force information in situ

EBIC Characterisation System

In situSEM

An easy-to-use EBIC and RCI nanoprobing analysis tool which is compatible with most commercially available SEM's and FIB's making it the ideal choice for circuit testing and probing.

Wildfire

In situTEM

Wildfire In situ TEM Heating

Lightning

In situTEM

In Situ TEM Biasing & Heating
Sample Dynamics under controlled electrical and thermal environment.

Stream∞

In situTEM

In situ TEM liquid platform with heating and biasing

NanoWorkstation

FIBIn situSEM

The NanoWorkstation is a powerful, dedicated system that allows physical manipulation and characterisation at the micro and nano-scale with ease adding new capabilities to your SEM or FIB/SEM instrument.

ProbeWorkstation for Electrical Characterisation of Semiconductors

FIBIn situSEM

The ProbeWorkstation is a powerful, dedicated system for electrical characterisation of semiconductor devices and advanced materials in SEM and FIB. The optimal combination of our market-leading nano-manipulation and probing products provide a versatile, integrated solution for failure analysis and R&D applications requiring stable, low-current measurements.

Model 2020 Advanced Tomography Holder

In situTEM

A revolutionary holder that allows room temperature data collection over wide tilt and translation ranges, even in restrictive pole-piece gap geometries

The Climate gas & heating solution enables dynamic studies of cyclic specimen transformations in gaseous environments at elevated temperatures and sub-Angstrom level.

Climate∞

Key Features

Contact

Brochure

AXT Supplier page

Supplier website

Vaporizer

Climate – Gas and Heating TEM Platform

Lightning Arctic – In situ TEM Solution with Cooling/Heating and Biasing

ExoSEM - Ex Situ Bench for Thermo-Mechanical Testing

FurnaSEM - in situ SEM Furnace

MT 1000 Tensile/Compression Stage

TESCAN TENSOR - 4D STEM

Model 1062 TrionMill

Celeritas

Apollo

TESCAN VEGA Compact

Model 2560 Vacuum Transfer Tomography Holder

FIB Stub 3.0

TESCAN SOLARIS X - Xe Plasma FIB-SEM for Semiconductors

TESCAN DynaTOM

Model 2550 Cryo Transfer Tomography Holder

Model 1070 NanoClean

Model 1051 TEM Mill

Model 1080 PicoMill

Heating Module

Cryo Module 80 Kelvin

SEM Peltier Module

SEM Add-on Tools

Transfer Module

Bending Module

DE-64

DE-16

DE-DirectView

TESCAN MIRA

TESCAN CoreTOM

TESCAN UniTOM XL

Model 1040 NanoMill

TESCAN VEGA

TESCAN AMBER 2 - Ga FIB-SEM

TESCAN AMBER X 2 - Plasma FIB-SEM

MM3E Micromanipulator

Tensile/Compression Module

SuperFlat AFM

EBIC Characterisation System

Wildfire

Lightning

Stream∞

NanoWorkstation

ProbeWorkstation for Electrical Characterisation of Semiconductors

Model 2020 Advanced Tomography Holder