On demand webinar Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) are two of the most used, complementary techniques for surface analysis at the nanoscale. Combining them by integrating a compact AFM LiteScope™ into an SEM brings novel ...
X-ray diffraction (XRD) is a staple tool for materials identification in materials science. It is commonly used to determine the phase assemblage of crystalline materials, i.e. for materials like Silica ...
Dynamic Micro-CT takes Computed Tomography to the Next Dimension – 4D
On-Demand Webinar This webinar presented by Dr. Will Rickard form Curtin University covers the theory and applications of FIB-SEM based ToF-SIMS. ToF-SIMS is a recently developed technique that provides elemental ...
By Dr. Hesam Shahali1, Dr. Cameron Chai2, Dr. Kamran Khajehpour2 and Prof. Prasad KDV Yarlagadda OAM1 From spider’s silk which exhibits strength 3 time greater than aramid fibres and 5 ...
CPEM marries ultra-high-resolution 2D images from an SEM with nanometre resolution 3D images from an AFM creating richer datasets.
Learn about the benfits and applications of Celeritas Celeritas is Direct Electron’s new 4D STEM camera. 4D STEM is a cutting-edge technique that uses the richness of information available in ...
AXT offers a wide range of Computed Tomography solutions including turnkey systems from Yxlon, TESCAN, Rigaku and Sigray or we can build bespoke system to suit your exacting requirements.
X-ray absorption spectrometry (XAS) is a powerful synchrotron-based technique that enables determination of the chemical and electronic state of an element of interest, including: Oxidation state Local atomic geometry Bond ...
Benchtop NMR is an ideal technique for research into battery technology, battery materials and quality control of battery raw materials. With the ability to quantify key material concentrations in minutes, ...
