d1 – microCT for Small to Medium Samples

Powerful Micro CT System for Small to Medium-Sized Components

Combining high spatial and temporal resolution

  • Diondo d1 Powerful Micro CT System for Small to Medium-Sized Components

    Key Features

    • Breathtaking resolution - Using extremely short scan times
    • High power transmission X-ray source - 240kV at 80W
    • High-precision manipulator - Granite base for rigidity and stability
    • Co-ordinate measuring technology - Reproducibly satisfies stringent demands of VDI/VDE 2630-1.3
    • Advanced scanning modes - Including helical scanning for high flexibility

The diondo d1 excels by providing a fourfold increase in resolution for the same measurement time as other competitive systems. Similarly, it can achieve the same resolution as other systems, but four times faster. This increase in performance is due to the 240kV transmission X-ray tube with an ultimate target power of 80W. This makes it suitable for a range of applications including additive manufacturing, batteries, materials science (including fibre-reinforced composite materials) and metrology.

This X-ray tube design contrasts with conventional reflection tubes where the high power required to penetrate dense/thick samples negatively impacts resolution. By their very design, higher power sources lead to lower resolutions. While this can be combated with longer scan times, that also brings with it obvious disadvantages. As mentioned, the transmission tube used in the diondo d1 architecture does not suffer from these disadvantages.

Usability is further enhanced by the large X-ray detector. This large area detector with tightly spaced pixel grid enables both extremely high-resolution scanning of smaller samples and imaging of larger samples in one scan. This eliminates the need for time-consuming partial scans at the expense of precision.

  • All
  • Additive Manufacturing
  • Computed Tomography
  • Computed Tomography - Life Sci
  • Fluoroscopy
  • In situ
  • Radiography
  • X-ray Imaging
  • X-ray Microscopy