A fast and sensitive optical CL imaging system that uses a plasma source and doesn't need a SEM to work.

A versatile platform ideally suited to FIB-SEM applications in an UHV and contamination free environment

Model 1062 TrionMill is an excellent tool for creating the sample surface characteristics needed for SEM imaging and analyses at shortest possible time and largest possible size.

Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.

METEOR is the world’s first and only fully integrated solution to optimise the cryo-ET workflow by reducing complicated transfer steps and increasing sample yield

Xe plasma FIB-SEM for Semiconductors

SPARC: High-performance SEM cathodoluminescence detector

The E5AT stage is a five-axis positioning tool especially designed to allow tilting samples to ±90 deg while allowing unlimited rotation of the sample and keeping the area of interest at the eucentric position.

Cleans specimens and holders immediately before insertion into an electron microscope; removes existing carbonaceous debris from the specimen and prevents contamination during imaging and analysis

Table top precision preparation for producing high quality SEM samples for a wide variety of applications

A stable heating module capable of temperatures up to 1500°C for a range of in situ SEM studies with gas capable micro-environments enabled

An extremely low vibration level cryo module that runs on liquid nitrogen, adding new capabilities to your SEM

With rapid temperature changes and precise control using a PID-controller, combined with quick lock connectors for fast turn around, makes this the perfect peltier stage

With rise time values <100 picoseconds, this beam blanker is ideally suited to the fast stroboscopic imaging required in voltage contrast, EBIC, OBIC, time-resolved cathodoluminescence and electron-beam lithography

Ingenious add-on tools for in situ experimentation that brings new capabilities to your SEM

Made for the purpose of carrying delicate and sensitive specimens in a capsule from the SEM into a glove box, or vice versa, to ensure they are protected from air or moisture at all times.

World leading in situ materials testing of bending characteristics using your SEM

Versatile and powerful FEG SEM

Analytical SEM for materials science and life science applications in research and industry

The most versatile and universal analytical Ga FIB-SEM platform on the market

Combining the speed of a plasma FIB with the resolution of a Ga FIB

The TIMA is the most advanced Automated Mineralogy system

Adding capabilities from in situ lift-out, electrical probing (FA)and nano-manipulation, the encoded MM3E micro-manipulator brings new functionality to your SEM or FIB/SEM instrument

World leading in situ materials testing of tensile and compression characteristics using your SEM

The combination of Atomic Force Microscopy (AFM) and Scanning Electron Microscopes (SEM) opens the possibility of combining information on lateral dimensions and material from SEM inspection that can be readily complemented by precise topographical and force information in situ

An easy-to-use EBIC and RCI nanoprobing analysis tool which is compatible with most commercially available SEM's and FIB's making it the ideal choice for circuit testing and probing.

The NanoWorkstation is a powerful, dedicated system that allows physical manipulation and characterisation at the micro and nano-scale with ease adding new capabilities to your SEM or FIB/SEM instrument.

The ProbeWorkstation is a powerful, dedicated system for electrical characterisation of semiconductor devices and advanced materials in SEM and FIB. The optimal combination of our market-leading nano-manipulation and probing products provide a versatile, integrated solution for failure analysis and R&D applications requiring stable, low-current measurements.