Model 1040 NanoMill

NanoMill TEM specimen preparation system

The NanoMill system is the ultimate companion for your FIB to optimise TEM specimen preparation quality

Key Features
- Achieve ultimate specimen quality free from amorphous and implanted layers
- Complements FIB technology by removing damaged areas and Milling without introduction of artefacts
- In situ imaging with ions and electrons to lacoate the lamela precisely
- Ultra-low ion energies inert gas Low energy Ar source (50 eV to 2 kV) with sub-micron beam diameter
- Software controlled operation Total control of all milling/polishing parameters Storage of recipes for rapid recall

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