ZSX Primus IV – High-Througput Tube Above XRF

Powerful WDXRF for quantitative elemental analysis with mapping and multi-point analysis

A powerful tube above WDXRF with closely coupled optics and a high intensity 30 micron tube window.
Dual vacuum technology and specialty crystals for ultra light elements
Mapping and point analysis

  • Rigaku Primus IV XRF

    Key Features

    • Tube above optics Prevents spills and damage to the tube
    • 30 Micron tube window Improved light element performance
    • ZSX Guidance expert system software ZSX Guidance supports you in all aspects of XRF measurement and data analysis.
    • Mapping feature for elemental topography/distribution Micro-XRF capability
    • Powerful 4kW instrument so analyse is quick

The Rigaku ZSX® Primus IV is a tube above XRF (X-ray fluorescence) spectrometer that provides unequalled flexibility, sensitivity and reliability.

The ZSX Primus IV spectrometer includes automatic pressure control and a dual pump vacuum system – goniometer chamber is always maintained under a constant vacuum. Samples may be loaded and pumped down while another is being analysed. This dramatically increase sample throughput while keeping the optics under a constant vacuum. Automatic cleaning of the proportional counter detector center wire ensures consistent performance. A sealed proportional counter (S-PC) option is available, eliminating the need for P10 gas.

The tube above optics provides exceptional light element XRF performance.  Additionally, never again worry about a contaminated beam path or down time due to sample chamber maintenance.  Optics-above geometry eliminates cleaning worries and increases up time while the  a 30micron tube, provides exceptional light element (low-Z) detection limits  – the thinnest end-window tube available in the industry.

The standard 48-position automatic sample changer. Up to four 12-position trays may be loaded at any given time. A 96 Position option is available as well.

The ZSX software is similar across all Rigaku XRF instruments allowing the operator to seamlessly switch from the Supermini to Primus Series instruments.

  • Key Features:
    The Primus IV XRF will analysis all elements from Be to U. This is made easy with the ZSX Guidance expert system and EZ Analysis interface for routine measurement software.

    Hardware features a digital multi-channel analyzer (D-MCA) while tube above optics reduces the optical path and minimizes contamination issues. As mentioned above the unique 30μ tube delivers superior light element performance. The instrument’s small footprint makes effective of valuable lab space.

    Additionally the Primus IV is capable of micro analysis to 500 µm and elemental of topography and/or distribution is possible.

  • All
  • CL
  • CLEM
  • EBSD
  • EDS
  • Electron Beam Lithography (EBL)
  • Electron Microscopy
  • Fusion
  • In situ
  • Micro XRF
  • Microscopy
  • Sample Preparation
  • SEM
  • WDS
  • XRF