Ultra High Strain Rate (UHS) Module

World’s fastest nanoindenter

Redefining the boundaries of high strain rate and impact testing

Key Features
- Pioneering high strain rate testing - Microscale testing with over a decade of expertise
- Exceptional performance - Maximum strain rates with precise control
- Versatile testing platform - Perfect for advanced indentation, tensile and compression testing
- Unmatched strain rate range - Strain rates from 0.0001 to 10,000 /s, the fastest in micro-mechanical testing
- Advanced testing features - Controlled strain rates and real-time data analysis without complex modeling
- High strain rate nanoindentation - Nanoindentation experiments one million times faster than standard methods
- High strain rate micro compression - Provides constant strain rates with true displacement control

The Alemnis Ultra High Strain rate (UHS) module offers the highest strain rate of any system on the market. Offering nine orders of magnitude of strain rates for indentation, tensile and compression testing, the Alemnis UHS is the world’s fastest micromechanical testing system. This enables extreme experiments that are, simply not possible with other systems.

Strain rate (s^-1) is the inverse value of the time it takes to perform the mechanical loading. As a result, experiments take as little as 0.1 ms at maximum strain rates.

The UHS is unique in that it is the only system that offers:

Constant and controlled strain rates
Continuous testing from quasi-static to high strain rates
Read-out frequency of 1 MHz for displacement and load.
Direct data analysis without complicated modeling or system assumptions

The UHS can perform experiments such as:

Nanoindentation
Micro compression

It can also be adapted to running experiments in various environments such as:

Low temperatures – -150°C to 200°C
High temperatures – Up to 1000°C
Relative humidity – 5 to 95% at 25 to 70°C
Liquids – Full immersion in liquids, electrochemical testing

All
AFM/SPM/SNOM
CL
CLEM
Computed Tomography
EBSD
EDS
Electron Beam Lithography (EBL)
Electron Microscopy
Fabrication
FIB
In situ
Micro XRF
Microscopy
SEM
TEM
Thermal Probe Lithography
WDS
X-ray Imaging
X-ray Microscopy

ASA Nanoindenter - Micromechanical Testing System

ASA Nanoindenter - Micromechanical Testing System

In situ

High-precision nanoindenter that can be customised with a range of accessories, consumables and controllers

LTM-Cryo Low Temperature Module

LTM-Cryo Low Temperature Module

In situ

Retrofittable to the Alemnis ASA Nanoindenter/Micromechanical testing system

HTM-1000 High Temperature Module

HTM-1000 High Temperature Module

In situ

Retrofittable to the Alemnis ASA Nanoindenter/Micromechanical testing system

Lightning Arctic – In situ TEM Solution with Cooling/Heating and Biasing

Lightning Arctic – In situ TEM Solution with Cooling/Heating and Biasing

In situ

In Situ TEM Cooling, Biasing & Heating for your TEM

ExoSEM - Ex Situ Bench for Thermo-Mechanical Testing

ExoSEM - Ex Situ Bench for Thermo-Mechanical Testing

In situ

360° viewing during a thermal or thermomechanical test outside your SEM

FurnaSEM - in situ SEM Furnace

FurnaSEM - in situ SEM Furnace

In situ

In Situ SEM furnace ideal for high temperature studies up to 1300°C. perform dynamic studies inside your SEM or under an optical microscope.

MT 1000 Tensile/Compression Stage

MT 1000 Tensile/Compression Stage

In situ

The most precise and functional thermo-mechanical testing system on the market

TESCAN VEGA Compact

TESCAN VEGA Compact

CLCLEMEBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyIn situMicro XRFSEMWDS

Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.

Model 2560 Vacuum Transfer Tomography Holder

Model 2560 Vacuum Transfer Tomography Holder

Electron MicroscopyIn situTEM

An ideal platform to protect environmentally sensitive material during transfer to TEM’s

FIB Stub 3.0

FIB Stub 3.0

In situ

Prepare lamellae directly on your Nano-chip inside your FIB

TESCAN DynaTOM

TESCAN DynaTOM

Computed TomographyIn situX-ray ImagingX-ray Microscopy

A dedicated 4D X-ray imaging

Model 2550 Cryo Transfer Tomography Holder

Model 2550 Cryo Transfer Tomography Holder

Electron MicroscopyIn situTEM

Cryo transfer and tomography of thin-film frozen-hydrated/vitrified specimens for low dose imaging and analysis

Heating Module

Heating Module

In situSEM

A stable heating module capable of temperatures up to 1500°C for a range of in situ SEM studies with gas capable micro-environments enabled

Cryo Module 80 Kelvin

Cryo Module 80 Kelvin

Electron MicroscopyFIBIn situSEM

An extremely low vibration level cryo module that runs on liquid nitrogen, adding new capabilities to your SEM

SEM Peltier Module

SEM Peltier Module

In situSEM

With rapid temperature changes and precise control using a PID-controller, combined with quick lock connectors for fast turn around, makes this the perfect peltier stage

SEM Add-on Tools

SEM Add-on Tools

In situSEM

Ingenious add-on tools for in situ experimentation that brings new capabilities to your SEM

Transfer Module

Transfer Module

Electron MicroscopyFIBIn situSEM

Made for the purpose of carrying delicate and sensitive specimens in a capsule from the SEM into a glove box, or vice versa, to ensure they are protected from air or moisture at all times.

Bending Module

Bending Module

In situSEM

World leading in situ materials testing of bending characteristics using your SEM

TESCAN MIRA

TESCAN MIRA

CLCLEMEBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyIn situMicro XRFSEMWDS

Versatile and powerful FEG SEM

TESCAN CoreTOM

TESCAN CoreTOM

Computed TomographyIn situX-ray ImagingX-ray Microscopy

Multiscale 3D core imaging

TESCAN UniTOM XL

TESCAN UniTOM XL

Computed TomographyIn situX-ray ImagingX-ray Microscopy

A unique alternative in Dynamic 3D X-ray imaging for your lab

TESCAN VEGA

TESCAN VEGA

CLCLEMEBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyIn situMicro XRFSEMWDS

Analytical SEM for materials science and life science applications in research and industry

TESCAN AMBER 2 - Ga FIB-SEM

TESCAN AMBER 2 - Ga FIB-SEM

EBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyFabricationFIBIn situMicroscopySEMTEMThermal Probe Lithography

The most versatile and universal analytical Ga FIB-SEM platform on the market

TESCAN AMBER X 2 - Plasma FIB-SEM

TESCAN AMBER X 2 - Plasma FIB-SEM

EBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyFabricationFIBIn situMicroscopySEMTEMThermal Probe Lithography

Combining the speed of a plasma FIB with the resolution of a Ga FIB

MM3E Micromanipulator

MM3E Micromanipulator

Electron MicroscopyFIBIn situSEM

Adding capabilities from in situ lift-out, electrical probing (FA)and nano-manipulation, the encoded MM3E micro-manipulator brings new functionality to your SEM or FIB/SEM instrument

Tensile/Compression Module

Tensile/Compression Module

EBSDEDSIn situSEM

World leading in situ materials testing of tensile and compression characteristics using your SEM

SuperFlat AFM

SuperFlat AFM

AFM/SPM/SNOMIn situSEM

The combination of Atomic Force Microscopy (AFM) and Scanning Electron Microscopes (SEM) opens the possibility of combining information on lateral dimensions and material from SEM inspection that can be readily complemented by precise topographical and force information in situ

EBIC Characterisation System

EBIC Characterisation System

In situSEM

An easy-to-use EBIC and RCI nanoprobing analysis tool which is compatible with most commercially available SEM's and FIB's making it the ideal choice for circuit testing and probing.

Climate∞

Climate∞

In situTEM

Characterise your materials with sub-Angstrom resolution with dynamic studies featuring precise control over electrical, thermal and gas environments

Wildfire

Wildfire

In situTEM

Wildfire In situ TEM Heating

Lightning

Lightning

In situTEM

In Situ TEM Biasing & Heating
Sample Dynamics under controlled electrical and thermal environment.

Stream∞

Stream∞

In situTEM

In situ TEM liquid platform with heating and biasing

NanoWorkstation

NanoWorkstation

FIBIn situSEM

The NanoWorkstation is a powerful, dedicated system that allows physical manipulation and characterisation at the micro and nano-scale with ease adding new capabilities to your SEM or FIB/SEM instrument.

Model 2020 Advanced Tomography Holder

Model 2020 Advanced Tomography Holder

In situTEM

A revolutionary holder that allows room temperature data collection over wide tilt and translation ranges, even in restrictive pole-piece gap geometries

Redefining the boundaries of high strain rate and impact testing