Electronics & Optics

Cutting-edge tools for research development in electronics and optics

Back to Materials Science

All
Additive Manufacturing
AFM/SPM/SNOM
ARPES
CL
Computed Tomography
Diffraction Imaging
Digital Microscopy
Electron Beam Lithography (EBL)
Fabrication
FIB
In situ
Laser spectroscopy
Micro XRD
Micro XRF
Microscopy
Powder
Raman
SAXS/WAXS
SEM
Spectrophotometry
TEM
Thermal Probe Lithography
Thin Film
X-ray Imaging
X-ray Microscopy
XRD & Diffraction

QuiiN - Versatile Ion Implantation System

QuiiN - Versatile Ion Implantation System

Fabrication

QuiiN Ion Implantation System - Nanoscale Quantum Ion Implanter

Quantum Diamond Computer - QDC

Quantum Diamond Computer - QDC

The world’s first room temperature quantum computer for education

Quantum Diamond Atomic Force Microscope - QDAFM

Quantum Diamond Atomic Force Microscope - QDAFM

AFM/SPM/SNOM

The Quantum Diamond Atomic Force Microscope has applications in physics, spintronics, materials science, life sciences, etc.

Lightning Arctic – In situ TEM Solution with Cooling/Heating and Biasing

Lightning Arctic – In situ TEM Solution with Cooling/Heating and Biasing

In situ

In Situ TEM Cooling, Biasing & Heating for your TEM

Cathodyne - Optical Cathodoluminescence

Cathodyne - Optical Cathodoluminescence

CL

A fast and sensitive optical CL imaging system that uses a plasma source and doesn't need a SEM to work.

FurnaSEM - in situ SEM Furnace

FurnaSEM - in situ SEM Furnace

In situ

In Situ SEM furnace ideal for high temperature studies up to 1300°C. perform dynamic studies inside your SEM or under an optical microscope.

TESCAN TENSOR - 4D STEM

TESCAN TENSOR - 4D STEM

TEM

A STEM that is as easy to use as a SEM

CERES - Metal Additive Micromanufacturing

CERES - Metal Additive Micromanufacturing

Additive Manufacturing

Metal additive manufacturing at the micron-scale

NPS Nano Point Scanner

NPS Nano Point Scanner

Digital MicroscopyMicroscopy

Metrology module for Hirox Digital Microscope – a complete inspection and measurement solution

TESCAN UniTOM - HR

TESCAN UniTOM - HR

Computed Tomography

The world's first sub-micron 600nm dynamic micro-CT allowing true 4D scanning with a temporal resolution of 5 seconds.

GemX Portable Digital Radiography Systems

GemX Portable Digital Radiography Systems

Computed TomographyX-ray Imaging

GemX portable X-ray generator for digital radiography

SmartLab

SmartLab

Micro XRDPowderSAXS/WAXSThin FilmXRD & Diffraction

The pinnacle instrument for X-ray materials analysis

Apollo

Apollo

Diffraction ImagingTEM

The world’s first event-based camera for high-throughput cryo-EM with no compromise in the QE and speed

TESCAN VEGA Compact

TESCAN VEGA Compact

CLElectron Beam Lithography (EBL)In situMicro XRFSEM

Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.

Model 2560 Vacuum Transfer Tomography Holder

Model 2560 Vacuum Transfer Tomography Holder

In situTEM

An ideal platform to protect environmentally sensitive material during transfer to TEM’s

HRX-01 Digital Microscope

HRX-01 Digital Microscope

Digital Microscopy

Bringing digital microscopy to a completely new level

TESCAN SOLARIS

TESCAN SOLARIS

FIB

Highest quality TEM lamellae preparation and superior analytical performance

TESCAN SOLARIS X - Xe Plasma FIB-SEM for Semiconductors

TESCAN SOLARIS X - Xe Plasma FIB-SEM for Semiconductors

Electron Beam Lithography (EBL)FabricationFIBMicroscopySEMTEM

Xe plasma FIB-SEM for Semiconductors

QM Quantum Microscope

QM Quantum Microscope

ARPESDiffraction ImagingLaser spectroscopy

Completely configurable, the QM comprises a laser source (EUV and/or VUV), amplifier, beamline tailored to the user’s experiment, and imaging or other analysis workstations that can effectively cover the microscopy/spectroscopy landscape for nano-to-quantum materials

XUUS4

XUUS4

ARPESLaser spectroscopy

A bench top source for EUV and soft X-rays

AttoMap

AttoMap

Micro XRF

The Most Advanced XRF Microscope Assembled for a Homelab

Hyperion VUV – vacuum ultraviolet source

Hyperion VUV – vacuum ultraviolet source

ARPES

KMLabs Hyperion VUV provides bright femtosecond pulses at numerous wavelengths across the vacuum ultraviolet (VUV) region, from 6.0 eV (205 nm) to 10.8 eV (115 nm). The discrete tunability of the KMLabs Hyperion VUV vacuum ultraviolet source enables researchers to study a wide range of materials and materials properties

RAEA Amplifier

RAEA Amplifier

ARPESLaser spectroscopy

RAEA is KMLabs' sub-25 fs, single-box amplifier. It is a fully engineered and integrated commercial source based on a single rugged optomechanical platform with a unique software-tunable repetition rate in order to maximise experiment flexibility

SPARC

SPARC

CLRamanSEM

SPARC: High-performance SEM cathodoluminescence detector

Eucentric Five Axis Table

Eucentric Five Axis Table

FIBSEM

The E5AT stage is a five-axis positioning tool especially designed to allow tilting samples to ±90 deg while allowing unlimited rotation of the sample and keeping the area of interest at the eucentric position.

Model 2550 Cryo Transfer Tomography Holder

Model 2550 Cryo Transfer Tomography Holder

In situTEM

Cryo transfer and tomography of thin-film frozen-hydrated/vitrified specimens for low dose imaging and analysis

Model 1051 TEM Mill

Model 1051 TEM Mill

Diffraction ImagingFIBTEM

Table top precision preparation for producing high quality TEM samples for a wide variety of applications

Cryo Module 80 Kelvin

Cryo Module 80 Kelvin

FIBIn situSEM

An extremely low vibration level cryo module that runs on liquid nitrogen, adding new capabilities to your SEM

SEM Add-on Tools

SEM Add-on Tools

In situSEM

Ingenious add-on tools for in situ experimentation that brings new capabilities to your SEM

Transfer Module

Transfer Module

FIBIn situSEM

Made for the purpose of carrying delicate and sensitive specimens in a capsule from the SEM into a glove box, or vice versa, to ensure they are protected from air or moisture at all times.

DE-64

DE-64

Diffraction ImagingTEM

Ideal for cryo-EM of very large viruses or cellular tomography. The DE-64 delivers user-adjustable full-frame streaming at up to 46 frames per second and offers unparalleled performance for electron counting.

DE-16

DE-16

Diffraction ImagingTEM

The DE-16 features the 10th generation of our revolutionary Direct Detection Device (DDD®) sensor, delivering industry-leading resolution and flexible, seamless viewing on a 4k x 4k field-of-view. The DE-16 is our most versatile direct detection TEM camera that enables TEM experiments not previously possible on a direct detector.

DE-DirectView

DE-DirectView

Diffraction ImagingTEM

Excellent upgrade option for your existing TEM offering low dose imaging, electron counting and 4D STEM

XRTmicron

XRTmicron

Thin FilmXRD & Diffraction

X-ray topography imaging system, for the non-destructive evaluation of single-crystalline materials.

TESCAN MIRA

TESCAN MIRA

CLElectron Beam Lithography (EBL)In situMicro XRFSEM

Versatile and powerful FEG SEM

JOLT

JOLT

CLSEM

Panchromatic and RGB Cathodoluminescence (CL) detector

TESCAN VEGA

TESCAN VEGA

CLElectron Beam Lithography (EBL)In situMicro XRFSEM

Analytical SEM for materials science and life science applications in research and industry

TESCAN AMBER 2 - Ga FIB-SEM

TESCAN AMBER 2 - Ga FIB-SEM

Electron Beam Lithography (EBL)FabricationFIBIn situMicroscopySEMTEMThermal Probe Lithography

The most versatile and universal analytical Ga FIB-SEM platform on the market

TESCAN AMBER X 2 - Plasma FIB-SEM

TESCAN AMBER X 2 - Plasma FIB-SEM

Electron Beam Lithography (EBL)FabricationFIBIn situMicroscopySEMTEMThermal Probe Lithography

Combining the speed of a plasma FIB with the resolution of a Ga FIB

Ti:Sapphire Laser Oscillators

Ti:Sapphire Laser Oscillators

Laser spectroscopySpectrophotometry

Ti:sapphire is the workhorse of ultrafast lasers due to its high gain bandwidth, enabling delivery of the shortest pulses and scalable to high pulse energy and average power. KMLabs provides a full suite of modelocked oscillators and integrated oscillator-amplifier systems, spanning pulse energies from the nJ range to 30 mJ in pulses from 15 to 40 fs.

Cheetah EVO 2D/3D Inspection System for Small Components

Cheetah EVO 2D/3D Inspection System for Small Components

Computed TomographyX-ray Imaging

The Cheetah EVO Plus includes new and improved features that make the system ready for the paradigm shift to a smart factory

Cougar EVO Series - CT for Small Parts and Electronics

Cougar EVO Series - CT for Small Parts and Electronics

Computed TomographyX-ray ImagingX-ray Microscopy

Scalable small footprint X-ray inspection systems for electronic componentry, and medical/military devices

MM3E Micromanipulator

MM3E Micromanipulator

FIBIn situSEM

Adding capabilities from in situ lift-out, electrical probing (FA)and nano-manipulation, the encoded MM3E micro-manipulator brings new functionality to your SEM or FIB/SEM instrument

SuperFlat AFM

SuperFlat AFM

AFM/SPM/SNOMIn situSEM

The combination of Atomic Force Microscopy (AFM) and Scanning Electron Microscopes (SEM) opens the possibility of combining information on lateral dimensions and material from SEM inspection that can be readily complemented by precise topographical and force information in situ

EBIC Characterisation System

EBIC Characterisation System

In situSEM

An easy-to-use EBIC and RCI nanoprobing analysis tool which is compatible with most commercially available SEM's and FIB's making it the ideal choice for circuit testing and probing.

Lightning

Lightning

In situTEM

In Situ TEM Biasing & Heating
Sample Dynamics under controlled electrical and thermal environment.

NanoWorkstation

NanoWorkstation

FIBIn situSEM

The NanoWorkstation is a powerful, dedicated system that allows physical manipulation and characterisation at the micro and nano-scale with ease adding new capabilities to your SEM or FIB/SEM instrument.

Model 2020 Advanced Tomography Holder

Model 2020 Advanced Tomography Holder

In situTEM

A revolutionary holder that allows room temperature data collection over wide tilt and translation ranges, even in restrictive pole-piece gap geometries

All
AFM/SPM/SNOM
FIB
SEM
Thin Film
Tomographic Microscopy
XRD & Diffraction

Examination of MoS<sub>2</sub> Using Simultaneous AFM and SEM Using the LiteScope

AFM/SPM/SNOMSEM

Ga FIB TEM Sample Preparation from 10nm FinFET

Ga FIB TEM Sample Preparation from 10nm FinFET

FIB

Field Ion Emission in An Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light

Tomographic Microscopy

Crystal defect analysis of a single crystal substrate by X-ray reflection topography

Crystal defect analysis of a single crystal substrate by X-ray reflection topography

Thin FilmXRD & Diffraction

Orsay Physics

Orsay Physics

CIQTEK

CIQTEK

DENSsolutions

DENSsolutions

NewTec Scientific

NewTec Scientific

TESCAN Group

TESCAN Group

Exaddon

Exaddon

Hirox

Hirox

X-RIS X-ray Imaging Solutions

X-RIS X-ray Imaging Solutions

Rigaku

Rigaku

Direct Electron

Direct Electron

Fischione Instruments

Fischione Instruments

KMLabs

KMLabs

SIGRAY

SIGRAY

Delmic

Delmic

Kleindiek Nanotechnik

Kleindiek Nanotechnik

Kammrath & Weiss

Kammrath & Weiss

Comet Yxlon

Comet Yxlon