Electronics

Specialised inspection and CT systems for advanced electronic applications

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All
Additive Manufacturing
CL
CLEM
Computed Tomography
EBSD
EDS
Electron Beam Lithography (EBL)
Fabrication
FIB
Hyperspectral
In situ
LIBS
Light Microscopy
Micro XRD
Micro XRF
Microscopy
Powder
Protein Crystallography
Radiography
Raman
SAXS/WAXS
SEM
Super Resolution Microscopy
TEM
Thermal Probe Lithography
Thin Film
WDS
X-ray Imaging
X-ray Microscopy
XRD & Diffraction

microArch Industrial Micro Precision 3D Printers

Additive ManufacturingFabrication

Ultra-high resolution, accuracy and precision

Apex XCT-100

Computed Tomography

Sigray’s Apex-XCT™ is a revolutionary 3D X-ray computed tomography (XCT) system optimised for flat samples.

VGSTUDIO MAX

Computed Tomography

High-end software for the analysis and visualisation of CT data

SmartLab

Micro XRDPowderSAXS/WAXSThin FilmXRD & Diffraction

The pinnacle instrument for X-ray materials analysis

TESCAN VEGA Compact

CLCLEMEBSDEDSElectron Beam Lithography (EBL)In situMicro XRFSEMWDS

Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.

Rigaku CT Lab HX

Additive ManufacturingComputed Tomography

Benchtop ergonomics Computed Tomography for materials science

TESCAN SOLARIS X - Xe Plasma FIB-SEM for Semiconductors

EBSDEDSElectron Beam Lithography (EBL)FabricationFIBMicroscopySEMTEMWDS

Xe plasma FIB-SEM for Semiconductors

COBRA

LIBS

MISSION:COBRA Process optimisation with the Continuous On Belt Real time Analysis of minerals and chemistry

AttoMap

Micro XRF

The Most Advanced XRF Microscope Assembled for a Homelab

SPARC

CLHyperspectralRamanSEM

SPARC: High-performance SEM cathodoluminescence detector

FF35 CT - Computed Tomography for Small and Medium Parts

Additive ManufacturingComputed TomographyX-ray ImagingX-ray Microscopy

High resolution industrial CT system for small/medium sized parts inspection

FF20 CT - MicroCT for Small Parts

Computed TomographyX-ray ImagingX-ray Microscopy

Ultimate automated semiconductor analysis

TESCAN DynaTOM

Computed TomographyIn situX-ray ImagingX-ray Microscopy

A dedicated 4D X-ray imaging

XRTmicron

Thin FilmXRD & Diffraction

X-ray topography imaging system, for the non-destructive evaluation of single-crystalline materials.

TESCAN MIRA

CLCLEMEBSDEDSElectron Beam Lithography (EBL)In situMicro XRFSEMWDS

Versatile and powerful FEG SEM

TESCAN CoreTOM

Computed TomographyIn situX-ray ImagingX-ray Microscopy

Multiscale 3D core imaging

TESCAN UniTOM XL

Computed TomographyIn situX-ray ImagingX-ray Microscopy

A unique alternative in Dynamic 3D X-ray imaging for your lab

TESCAN VEGA

CLCLEMEBSDEDSElectron Beam Lithography (EBL)In situMicro XRFSEMWDS

Analytical SEM for materials science and life science applications in research and industry

TESCAN AMBER 2 - Ga FIB-SEM

EBSDEDSElectron Beam Lithography (EBL)FabricationFIBIn situMicroscopySEMTEMThermal Probe Lithography

The most versatile and universal analytical Ga FIB-SEM platform on the market

TESCAN AMBER X 2 - Plasma FIB-SEM

EBSDEDSElectron Beam Lithography (EBL)FabricationFIBIn situMicroscopySEMTEMThermal Probe Lithography

Combining the speed of a plasma FIB with the resolution of a Ga FIB

NANOPIX

PowderProtein CrystallographySAXS/WAXSThin Film

Synchrotron level SAXS performance at your fingertips

EVO & ECO Series Tube head Accessories

RadiographyX-ray Imaging

Tube head stands and other accessories for YXLON radiographic systems

Cheetah EVO 2D/3D Inspection System for Small Components

Computed TomographyRadiographyX-ray Imaging

The Cheetah EVO Plus includes new and improved features that make the system ready for the paradigm shift to a smart factory

Cougar EVO Series - CT for Small Parts and Electronics

Computed TomographyRadiographyX-ray ImagingX-ray Microscopy

Scalable small footprint X-ray inspection systems for electronic componentry, and medical/military devices

NANORO M

Light MicroscopyMicroscopySuper Resolution Microscopy

Nanoro M- Super Resolution Optical Microscopy

All
FIB
Micro XRF
Microscopy
SAXS/WAXS
SEM
Thin Film
XPS/UPS/Auger
XRD & Diffraction

Analysis of Optical Fibres Using FIB-SEM and ToF-SIMS

The elemental analysis of doping elements distribution in optical fiber cross-sections requires a sensitive high spatial resolution like TOF-SIMS.

FIB

Dopant and Thin Film Analysis at Sub-Å Equivalent Thickness

Micro XRF

Analysis of Flexible OLEDs using an Xe plasma FIB-SEM

FIBMicroscopySEM

Particle Size And Shape

SAXS/WAXSXRD & Diffraction

Crystal defect analysis of a single crystal substrate by X-ray reflection topography

Thin FilmXRD & Diffraction

XPS/UPS/Auger

Electronics

microArch Industrial Micro Precision 3D Printers

Apex XCT-100

VGSTUDIO MAX

SmartLab

TESCAN VEGA Compact

Rigaku CT Lab HX

TESCAN SOLARIS X - Xe Plasma FIB-SEM for Semiconductors

COBRA

AttoMap

SPARC

FF35 CT - Computed Tomography for Small and Medium Parts

FF20 CT - MicroCT for Small Parts

TESCAN DynaTOM

XRTmicron

TESCAN MIRA

TESCAN CoreTOM

TESCAN UniTOM XL

TESCAN VEGA

TESCAN AMBER 2 - Ga FIB-SEM

TESCAN AMBER X 2 - Plasma FIB-SEM

NANOPIX

EVO & ECO Series Tube head Accessories

Cheetah EVO 2D/3D Inspection System for Small Components

Cougar EVO Series - CT for Small Parts and Electronics

NANORO M

Boston Micro Fabrication - BMF

SIGRAY

Volume Graphics

Rigaku

TESCAN Group

ELEMISSION

Delmic

Comet Yxlon

Comet X-ray

Nanoro