Engineering & Materials

The latest technology for the development and innovation into engineering and materials research

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Massbox – LALI-TOF-MS

Massbox – LALI-TOF-MS

LALI-TOF-MS - Laser Ablation Laser Induced Time of Flight Mass SpectrometryMass Spectrometry

Patented technology with trace element sensitivity, delivering results in minutes from a compact, user-friendly system

Prime 4K – 3D High-Resolution DLP Resin Printer

Prime 4K – 3D High-Resolution DLP Resin Printer

Additive ManufacturingBioprinting

Affordable DLP resin printer for microfluidics and dental

ExoSEM - Ex Situ Bench for Thermo-Mechanical Testing

ExoSEM - Ex Situ Bench for Thermo-Mechanical Testing

In situ

360° viewing during a thermal or thermomechanical test outside your SEM

FurnaSEM - in situ SEM Furnace

FurnaSEM - in situ SEM Furnace

In situ

In Situ SEM furnace ideal for high temperature studies up to 1300°C. perform dynamic studies inside your SEM or under an optical microscope.

MT 1000 Tensile/Compression Stage

MT 1000 Tensile/Compression Stage

In situ

The most precise and functional thermo-mechanical testing system on the market

ZSX Primus IVi - WDXRF Spectrometer

ZSX Primus IVi - WDXRF Spectrometer

XRF

Powerful WDXRF for quantitative elemental analysis with mapping and multi-point capability

TESCAN TENSOR - 4D STEM

TESCAN TENSOR - 4D STEM

TEM

A STEM that is as easy to use as a SEM

CERES - Metal Additive Micromanufacturing

CERES - Metal Additive Micromanufacturing

Additive Manufacturing

Metal additive manufacturing at the micron-scale

microArch Industrial Micro Precision 3D Printers

microArch Industrial Micro Precision 3D Printers

Additive ManufacturingFabrication

Ultra-high resolution, accuracy and precision

XtaLAB Synergy-ED - microED

XtaLAB Synergy-ED - microED

Electron DiffractionXRD & Diffraction

World's first turnkey electron diffractometer going beyond the limits of XRD.

NPS Nano Point Scanner

NPS Nano Point Scanner

Digital MicroscopyMicroscopy

Metrology module for Hirox Digital Microscope – a complete inspection and measurement solution

VGSTUDIO MAX

VGSTUDIO MAX

Computed Tomography

High-end software for the analysis and visualisation of CT data

TESCAN UniTOM - HR

TESCAN UniTOM - HR

Computed Tomography

The world's first sub-micron 600nm dynamic micro-CT allowing true 4D scanning with a temporal resolution of 5 seconds.

NanoOne

NanoOne

Additive ManufacturingFabrication

NanoOne high throughput 3D printer with sub-micron resolution

SmartLab

SmartLab

Micro XRDPowderSAXS/WAXSThin FilmXRD & Diffraction

The pinnacle instrument for X-ray materials analysis

XtaLAB Synergy-DW - Dual Wavelength Single Crystal XRD

XtaLAB Synergy-DW - Dual Wavelength Single Crystal XRD

Micro XRDSmall MoleculeXRD & Diffraction

X-ray crystallography at it's finest

XtaLAB Synergy-R

XtaLAB Synergy-R

Micro XRDSmall MoleculeXRD & Diffraction

X-ray crystallography at it's finest

XtaLAB Synergy-S

XtaLAB Synergy-S

Micro XRDPowderSmall MoleculeXRD & Diffraction

The world's favourite X-ray crystallography system

ZSX Primus IV - High-Througput Tube Above XRF

ZSX Primus IV - High-Througput Tube Above XRF

XRF

Powerful tube above WDXRF for quantitative elemental analysis with mapping and multi-point capability

Apollo

Apollo

Diffraction ImagingTEM

The world’s first event-based camera for high-throughput cryo-EM with no compromise in the QE and speed

TESCAN VEGA Compact

TESCAN VEGA Compact

EBSDEDSElectron Beam Lithography (EBL)In situMicro XRFSEMWDS

Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.

Model 2560 Vacuum Transfer Tomography Holder

Model 2560 Vacuum Transfer Tomography Holder

In situTEM

An ideal platform to protect environmentally sensitive material during transfer to TEM’s

FF85 CT

FF85 CT

Computed TomographyX-ray ImagingX-ray Microscopy

High-power, high-resolution computed tomography system ideally suited for inspections of a wide variety of small to medium sized items

AutoMate II

AutoMate II

Micro XRD

Highly accurate micro area residual stress analyser with both iso- and side-inclination methods

HRX-01 Digital Microscope

HRX-01 Digital Microscope

Digital Microscopy

Bringing digital microscopy to a completely new level

TESCAN SOLARIS X - Xe Plasma FIB-SEM for Semiconductors

TESCAN SOLARIS X - Xe Plasma FIB-SEM for Semiconductors

EBSDEDSElectron Beam Lithography (EBL)FabricationFIBMicroscopySEMTEMWDS

Xe plasma FIB-SEM for Semiconductors

QM Quantum Microscope

QM Quantum Microscope

Diffraction ImagingLaser spectroscopy

Completely configurable, the QM comprises a laser source (EUV and/or VUV), amplifier, beamline tailored to the user’s experiment, and imaging or other analysis workstations that can effectively cover the microscopy/spectroscopy landscape for nano-to-quantum materials

XUUS4

XUUS4

Laser spectroscopy

A bench top source for EUV and soft X-rays

AttoMap

AttoMap

Micro XRF

The Most Advanced XRF Microscope Assembled for a Homelab

RAEA Amplifier

RAEA Amplifier

Laser spectroscopy

RAEA is KMLabs' sub-25 fs, single-box amplifier. It is a fully engineered and integrated commercial source based on a single rugged optomechanical platform with a unique software-tunable repetition rate in order to maximise experiment flexibility

FF35 CT - Computed Tomography for Small and Medium Parts

FF35 CT - Computed Tomography for Small and Medium Parts

Additive ManufacturingComputed TomographyX-ray ImagingX-ray Microscopy

High resolution industrial CT system for small/medium sized parts inspection

FF20 CT - MicroCT for Small Parts

FF20 CT - MicroCT for Small Parts

Computed TomographyX-ray ImagingX-ray Microscopy

Ultimate automated semiconductor analysis

Eucentric Five Axis Table

Eucentric Five Axis Table

EDSFIBSEM

The E5AT stage is a five-axis positioning tool especially designed to allow tilting samples to ±90 deg while allowing unlimited rotation of the sample and keeping the area of interest at the eucentric position.

TESCAN DynaTOM

TESCAN DynaTOM

Computed TomographyIn situX-ray ImagingX-ray Microscopy

A dedicated 4D X-ray imaging

Rod Crusher

Rod Crusher

Sample Preparation

Contactless crushing of high purity products with less than parts per trillion levels of introduced contamination

Model 2550 Cryo Transfer Tomography Holder

Model 2550 Cryo Transfer Tomography Holder

In situTEM

Cryo transfer and tomography of thin-film frozen-hydrated/vitrified specimens for low dose imaging and analysis

Model 1070 NanoClean

Model 1070 NanoClean

SEMTEM

Cleans specimens and holders immediately before insertion into an electron microscope; removes existing carbonaceous debris from the specimen and prevents contamination during imaging and analysis

Model 1051 TEM Mill

Model 1051 TEM Mill

Diffraction ImagingFIBTEM

Table top precision preparation for producing high quality TEM samples for a wide variety of applications

Model 1080 PicoMill

Model 1080 PicoMill

Diffraction ImagingFIBTEM

The FIB is highly effective in preparing TEM specimens, but the use of a high-energy, liquid metal ion source can often result in specimen amorphization, gallium implantation, or both. Let the FIB do what the FIB does best; let the PicoMill system do the rest

Model 1061 SEM Mill

Model 1061 SEM Mill

EBSDEDSMicro XRFSEMWDS

Table top precision preparation for producing high quality SEM samples for a wide variety of applications

Heating Module

Heating Module

In situSEM

A stable heating module capable of temperatures up to 1500°C for a range of in situ SEM studies with gas capable micro-environments enabled

SEM Peltier Module

SEM Peltier Module

In situSEM

With rapid temperature changes and precise control using a PID-controller, combined with quick lock connectors for fast turn around, makes this the perfect peltier stage

Electrostatic Beam Blanker

Electrostatic Beam Blanker

SEM

With rise time values <100 picoseconds, this beam blanker is ideally suited to the fast stroboscopic imaging required in voltage contrast, EBIC, OBIC, time-resolved cathodoluminescence and electron-beam lithography

SEM Add-on Tools

SEM Add-on Tools

In situSEM

Ingenious add-on tools for in situ experimentation that brings new capabilities to your SEM

Transfer Module

Transfer Module

FIBIn situSEM

Made for the purpose of carrying delicate and sensitive specimens in a capsule from the SEM into a glove box, or vice versa, to ensure they are protected from air or moisture at all times.

Bending Module

Bending Module

In situSEM

World leading in situ materials testing of bending characteristics using your SEM

DE-64

DE-64

Diffraction ImagingTEM

Ideal for cryo-EM of very large viruses or cellular tomography. The DE-64 delivers user-adjustable full-frame streaming at up to 46 frames per second and offers unparalleled performance for electron counting.

DE-16

DE-16

Diffraction ImagingTEM

The DE-16 features the 10th generation of our revolutionary Direct Detection Device (DDD®) sensor, delivering industry-leading resolution and flexible, seamless viewing on a 4k x 4k field-of-view. The DE-16 is our most versatile direct detection TEM camera that enables TEM experiments not previously possible on a direct detector.

DE-DirectView

DE-DirectView

Diffraction ImagingTEM

Excellent upgrade option for your existing TEM offering low dose imaging, electron counting and 4D STEM

XRTmicron

XRTmicron

Thin FilmXRD & Diffraction

X-ray topography imaging system, for the non-destructive evaluation of single-crystalline materials.

TESCAN MIRA

TESCAN MIRA

EBSDEDSElectron Beam Lithography (EBL)In situMicro XRFSEMWDS

Versatile and powerful FEG SEM

TESCAN CoreTOM

TESCAN CoreTOM

Computed TomographyIn situX-ray ImagingX-ray Microscopy

Multiscale 3D core imaging

TESCAN UniTOM XL

TESCAN UniTOM XL

Computed TomographyIn situX-ray ImagingX-ray Microscopy

A unique alternative in Dynamic 3D X-ray imaging for your lab

Model 1040 NanoMill

Model 1040 NanoMill

Diffraction ImagingFIBTEM

The NanoMill system is the ultimate companion for your FIB to optimise TEM specimen preparation quality

TESCAN VEGA

TESCAN VEGA

EBSDEDSElectron Beam Lithography (EBL)In situMicro XRFSEMWDS

Analytical SEM for materials science and life science applications in research and industry

TESCAN AMBER 2 - Ga FIB-SEM

TESCAN AMBER 2 - Ga FIB-SEM

EBSDEDSElectron Beam Lithography (EBL)FabricationFIBIn situMicroscopySEMTEM

The most versatile and universal analytical Ga FIB-SEM platform on the market

TESCAN AMBER X 2 - Plasma FIB-SEM

TESCAN AMBER X 2 - Plasma FIB-SEM

EBSDEDSElectron Beam Lithography (EBL)FabricationFIBIn situMicroscopySEMTEM

Combining the speed of a plasma FIB with the resolution of a Ga FIB

NANOPIX mini

NANOPIX mini

SAXS/WAXS

The world's first benchtop SAXS instrument

NANOPIX

NANOPIX

PowderSAXS/WAXSThin Film

Synchrotron level SAXS performance at your fingertips

SmartLab SE

SmartLab SE

Micro XRDPowderSAXS/WAXSThin FilmXRD & Diffraction

Multipurpose XRD and Materials Analysis

Lab

Lab

Sample Preparation

Selective fragmentation for liberating material along their grain boundaries

Ti:Sapphire Laser Oscillators

Ti:Sapphire Laser Oscillators

Laser spectroscopySpectrophotometry

Ti:sapphire is the workhorse of ultrafast lasers due to its high gain bandwidth, enabling delivery of the shortest pulses and scalable to high pulse energy and average power. KMLabs provides a full suite of modelocked oscillators and integrated oscillator-amplifier systems, spanning pulse energies from the nJ range to 30 mJ in pulses from 15 to 40 fs.

Simultix 15 - High-Speed Simultaneous XRF

Simultix 15 - High-Speed Simultaneous XRF

XRF

High Power tube above simultaneous WDXRF, for high-throughput elemental analysis of solids, powders and alloys.

Cheetah EVO 2D/3D Inspection System for Small Components

Cheetah EVO 2D/3D Inspection System for Small Components

Computed TomographyX-ray Imaging

The Cheetah EVO Plus includes new and improved features that make the system ready for the paradigm shift to a smart factory

Cougar EVO Series - CT for Small Parts and Electronics

Cougar EVO Series - CT for Small Parts and Electronics

Computed TomographyX-ray ImagingX-ray Microscopy

Scalable small footprint X-ray inspection systems for electronic componentry, and medical/military devices

MM3E Micromanipulator

MM3E Micromanipulator

FIBIn situSEM

Adding capabilities from in situ lift-out, electrical probing (FA)and nano-manipulation, the encoded MM3E micro-manipulator brings new functionality to your SEM or FIB/SEM instrument

Tensile/Compression Module

Tensile/Compression Module

EBSDEDSIn situSEM

World leading in situ materials testing of tensile and compression characteristics using your SEM

Lightning

Lightning

In situTEM

In Situ TEM Biasing & Heating
Sample Dynamics under controlled electrical and thermal environment.

Stream∞

Stream∞

In situTEM

STREAM; In Situ TEM Liquid, Liquid Biasing and Liquid Heating

NanoWorkstation

NanoWorkstation

FIBIn situSEM

The NanoWorkstation is a powerful, dedicated system that allows physical manipulation and characterisation at the micro and nano-scale with ease adding new capabilities to your SEM or FIB/SEM instrument.

Model 2020 Advanced Tomography Holder

Model 2020 Advanced Tomography Holder

In situTEM

A revolutionary holder that allows room temperature data collection over wide tilt and translation ranges, even in restrictive pole-piece gap geometries

All
EBSD
FIB
Micro XRF
SAXS/WAXS
SEM
Tomographic Microscopy
XRD & Diffraction
XRF

SEM and EBSD analysis of the grain structure after ECAP process of the aluminium material

SEM and EBSD analysis of the grain structure after ECAP process of the aluminium material

EBSDSEM

Analysis of ceramic nano-particles

Analysis of ceramic nano-particles

Advanced BSE detection capabilities of the TESCAN CLARA UHR-SEM

Advanced BSE detection capabilities of the TESCAN CLARA UHR-SEM

SEM

Ga FIB TEM Sample Preparation from 10nm FinFET

Ga FIB TEM Sample Preparation from 10nm FinFET

FIB

Field Ion Emission in An Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light

Tomographic Microscopy

Particle Size And Shape

Particle Size And Shape

SAXS/WAXSXRD & Diffraction

Micro-Analysis and XRF Mapping on the ZSX Primus

Micro-Analysis and XRF Mapping
ZSX Primus

Micro XRFXRF

EXUM

EXUM

MiiCraft

MiiCraft

NewTec Scientific

NewTec Scientific

Rigaku

Rigaku

TESCAN Group

TESCAN Group

Exaddon

Exaddon

Boston Micro Fabrication - BMF

Boston Micro Fabrication - BMF

$Rigaku Oxford Diffraction$

Rigaku Oxford Diffraction

Hirox

Hirox

Volume Graphics

Volume Graphics

UpNano

UpNano

Direct Electron

Direct Electron

Fischione Instruments

Fischione Instruments

Comet Yxlon

Comet Yxlon

KMLabs

KMLabs

SIGRAY

SIGRAY

Kleindiek Nanotechnik

Kleindiek Nanotechnik

SELFRAG

SELFRAG

Kammrath & Weiss

Kammrath & Weiss

DENSsolutions

DENSsolutions