Metal additive manufacturing at the micron-scale

Ultra-high resolution, accuracy and precision

NanoOne high throughput 3D printer with sub-micron resolution

The pinnacle instrument for X-ray materials analysis

The world’s first event-based camera for high-throughput cryo-EM with no compromise in the QE and speed

Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.

The R GEN platform allows you to tailor your system to your specific requirements combining extrusion and light-based printing technologies.

3D bioprinting station in a biosafety enclosure, bringing the future of tissue engineering and regenerative medicine closer.

Highest quality TEM lamellae preparation and superior analytical performance

Xe plasma FIB-SEM for Semiconductors

An extremely low vibration level cryo module that runs on liquid nitrogen, adding new capabilities to your SEM

Made for the purpose of carrying delicate and sensitive specimens in a capsule from the SEM into a glove box, or vice versa, to ensure they are protected from air or moisture at all times.

Ideal for cryo-EM of very large viruses or cellular tomography. The DE-64 delivers user-adjustable full-frame streaming at up to 46 frames per second and offers unparalleled performance for electron counting.

The DE-16 features the 10th generation of our revolutionary Direct Detection Device (DDD®) sensor, delivering industry-leading resolution and flexible, seamless viewing on a 4k x 4k field-of-view. The DE-16 is our most versatile direct detection TEM camera that enables TEM experiments not previously possible on a direct detector.

X-ray topography imaging system, for the non-destructive evaluation of single-crystalline materials.

Versatile and powerful FEG SEM

Analytical SEM for materials science and life science applications in research and industry

The most versatile and universal analytical Ga FIB-SEM platform on the market

Combining the speed of a plasma FIB with the resolution of a Ga FIB

Adding capabilities from in situ lift-out, electrical probing (FA)and nano-manipulation, the encoded MM3E micro-manipulator brings new functionality to your SEM or FIB/SEM instrument

The combination of Atomic Force Microscopy (AFM) and Scanning Electron Microscopes (SEM) opens the possibility of combining information on lateral dimensions and material from SEM inspection that can be readily complemented by precise topographical and force information in situ

In Situ TEM Biasing & Heating
Sample Dynamics under controlled electrical and thermal environment.

The NanoWorkstation is a powerful, dedicated system that allows physical manipulation and characterisation at the micro and nano-scale with ease adding new capabilities to your SEM or FIB/SEM instrument.

The ProbeWorkstation is a powerful, dedicated system for electrical characterisation of semiconductor devices and advanced materials in SEM and FIB. The optimal combination of our market-leading nano-manipulation and probing products provide a versatile, integrated solution for failure analysis and R&D applications requiring stable, low-current measurements.