Nano Materials

The latest technology for advancing research in nano-materials

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Latest Review

The main attraction was the SPARC’s outstanding light collection efficiency which is made possible by a high precision alignment system for the parabolic mirror that collects the CL signal. Read more

Prof. Matthew PhillipsEmeritus Professor - Faculty of Science

TESCAN TENSOR - 4D STEM

TESCAN TENSOR - 4D STEM

TEM

A STEM that is as easy to use as a SEM

CERES - Metal Additive Micromanufacturing

CERES - Metal Additive Micromanufacturing

Additive Manufacturing

Metal additive manufacturing at the micron-scale

XtaLAB Synergy-ED - microED

XtaLAB Synergy-ED - microED

Electron DiffractionXRD & Diffraction

World's first turnkey electron diffractometer going beyond the limits of XRD.

LiteScope - AFM in Your SEM

LiteScope - AFM in Your SEM

AFM/SPM/SNOM

Correlative in situ AFM and SEM

NanoOne

NanoOne

Additive ManufacturingFabrication

NanoOne high throughput 3D printer with sub-micron resolution

SmartLab

SmartLab

Micro XRDPowderSAXS/WAXSThin FilmXRD & Diffraction

The pinnacle instrument for X-ray materials analysis

Apollo

Apollo

Diffraction ImagingTEM

The world’s first event-based camera for high-throughput cryo-EM with no compromise in the QE and speed

TESCAN VEGA Compact

TESCAN VEGA Compact

CLEBSDEDSElectron Beam Lithography (EBL)In situMicro XRFSEMWDS

Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.

METEOR

METEOR

SEM

METEOR is the world’s first and only fully integrated solution to optimise the cryo-ET workflow by reducing complicated transfer steps and increasing sample yield

HRX-01 Digital Microscope

HRX-01 Digital Microscope

Digital Microscopy

Bringing digital microscopy to a completely new level

TESCAN SOLARIS

TESCAN SOLARIS

FIB

Highest quality TEM lamellae preparation and superior analytical performance

TESCAN SOLARIS X - Xe Plasma FIB-SEM for Semiconductors

TESCAN SOLARIS X - Xe Plasma FIB-SEM for Semiconductors

EBSDEDSElectron Beam Lithography (EBL)FabricationFIBMicroscopySEMTEMWDS

Xe plasma FIB-SEM for Semiconductors

QuantumLeap XAS

QuantumLeap XAS

X-ray absorption spectroscopy (XANES/EXAFS)

X-ray Absorption Spectroscopy (XAS)

XUUS4

XUUS4

ARPESLaser spectroscopyX-ray absorption spectroscopy (XANES/EXAFS)

A bench top source for EUV and soft X-rays

SPARC

SPARC

CLHyperspectralRamanSEM

SPARC: High-performance SEM cathodoluminescence detector

Eucentric Five Axis Table

Eucentric Five Axis Table

EDSFIBSEM

The E5AT stage is a five-axis positioning tool especially designed to allow tilting samples to ±90 deg while allowing unlimited rotation of the sample and keeping the area of interest at the eucentric position.

Cryo Module 80 Kelvin

Cryo Module 80 Kelvin

FIBIn situSEM

An extremely low vibration level cryo module that runs on liquid nitrogen, adding new capabilities to your SEM

Transfer Module

Transfer Module

FIBIn situSEM

Made for the purpose of carrying delicate and sensitive specimens in a capsule from the SEM into a glove box, or vice versa, to ensure they are protected from air or moisture at all times.

DE-64

DE-64

Diffraction ImagingTEM

Ideal for cryo-EM of very large viruses or cellular tomography. The DE-64 delivers user-adjustable full-frame streaming at up to 46 frames per second and offers unparalleled performance for electron counting.

DE-16

DE-16

Diffraction ImagingTEM

The DE-16 features the 10th generation of our revolutionary Direct Detection Device (DDD®) sensor, delivering industry-leading resolution and flexible, seamless viewing on a 4k x 4k field-of-view. The DE-16 is our most versatile direct detection TEM camera that enables TEM experiments not previously possible on a direct detector.

DE-DirectView

DE-DirectView

Diffraction ImagingTEM

Excellent upgrade option for your existing TEM offering low dose imaging, electron counting and 4D STEM

XRTmicron

XRTmicron

Thin FilmXRD & Diffraction

X-ray topography imaging system, for the non-destructive evaluation of single-crystalline materials.

TESCAN MIRA

TESCAN MIRA

CLEBSDEDSElectron Beam Lithography (EBL)In situMicro XRFSEMWDS

Versatile and powerful FEG SEM

JOLT

JOLT

CLEDSSEM

Panchromatic and RGB Cathodoluminescence (CL) detector

TESCAN VEGA

TESCAN VEGA

CLEBSDEDSElectron Beam Lithography (EBL)In situMicro XRFSEMWDS

Analytical SEM for materials science and life science applications in research and industry

TESCAN AMBER 2 - Ga FIB-SEM

TESCAN AMBER 2 - Ga FIB-SEM

EBSDEDSElectron Beam Lithography (EBL)FabricationFIBIn situMicroscopySEMTEMThermal Probe Lithography

The most versatile and universal analytical Ga FIB-SEM platform on the market

TESCAN AMBER X 2 - Plasma FIB-SEM

TESCAN AMBER X 2 - Plasma FIB-SEM

EBSDEDSElectron Beam Lithography (EBL)FabricationFIBIn situMicroscopySEMTEMThermal Probe Lithography

Combining the speed of a plasma FIB with the resolution of a Ga FIB

NANOPIX

NANOPIX

PowderProtein CrystallographySAXS/WAXSThin Film

Synchrotron level SAXS performance at your fingertips

MM3E Micromanipulator

MM3E Micromanipulator

FIBIn situSEM

Adding capabilities from in situ lift-out, electrical probing (FA)and nano-manipulation, the encoded MM3E micro-manipulator brings new functionality to your SEM or FIB/SEM instrument

Tensile/Compression Module

Tensile/Compression Module

EBSDEDSIn situSEM

World leading in situ materials testing of tensile and compression characteristics using your SEM

Climate∞

Climate∞

In situTEM

Characterise your materials with sub-Angstrom resolution with dynamic studies featuring precise control over electrical, thermal and gas environments

Wildfire

Wildfire

In situTEM

Wildfire In situ TEM Heating

Stream∞

Stream∞

In situTEM

In situ TEM liquid platform with heating and biasing

NanoWorkstation

NanoWorkstation

FIBIn situSEM

The NanoWorkstation is a powerful, dedicated system that allows physical manipulation and characterisation at the micro and nano-scale with ease adding new capabilities to your SEM or FIB/SEM instrument.

NANORO M

NANORO M

Light MicroscopyMicroscopySuper Resolution Microscopy

Nanoro M- Super Resolution Optical Microscopy

ProbeWorkstation for Electrical Characterisation of Semiconductors

ProbeWorkstation for Electrical Characterisation of Semiconductors

FIBIn situSEM

The ProbeWorkstation is a powerful, dedicated system for electrical characterisation of semiconductor devices and advanced materials in SEM and FIB. The optimal combination of our market-leading nano-manipulation and probing products provide a versatile, integrated solution for failure analysis and R&D applications requiring stable, low-current measurements.

All
CL
SAXS/WAXS
SEM
Thin Film
Tomographic Microscopy
XRD & Diffraction

Advanced BSE detection capabilities of the TESCAN CLARA UHR-SEM

Advanced BSE detection capabilities of the TESCAN CLARA UHR-SEM

SEM

Field Ion Emission in An Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light

Tomographic Microscopy

Particle Size And Shape

Particle Size And Shape

SAXS/WAXSXRD & Diffraction

Crystal defect analysis of a single crystal substrate by X-ray reflection topography

Crystal defect analysis of a single crystal substrate by X-ray reflection topography

Thin FilmXRD & Diffraction

CL imaging of Zircon

Cl imaging of Zircon

CL

TESCAN Group

TESCAN Group

Exaddon

Exaddon

$Rigaku Oxford Diffraction$

Rigaku Oxford Diffraction

NenoVision

NenoVision

UpNano

UpNano

Rigaku

Rigaku

Direct Electron

Direct Electron

Delmic

Delmic

Hirox

Hirox

SIGRAY

SIGRAY

KMLabs

KMLabs

Kleindiek Nanotechnik

Kleindiek Nanotechnik

Kammrath & Weiss

Kammrath & Weiss

DENSsolutions

DENSsolutions

Nanoro

Nanoro