Microscopy & Microanalysis

Geological focused microscopy and microanalysis including SEM, Cathodoluminescence, µXRF and LIBS

Back to Geological Sciences Research

All
Additive Manufacturing
Automated Mineralogy
CL
CLEM
Computed Tomography
Computed Tomography - Life Sci
Core Scanning
Diffraction Imaging
Digital Microscopy
EBSD
EDS
Fabrication
FIB
Hyperspectral
In situ
LIBS
Micro XRF
Microscopy
Raman
SEM
TEM
WDS
X-ray Imaging
X-ray Microscopy

ASA Nanoindenter - Micromechanical Testing System

In situ

High-precision nanoindenter that can be customised with a range of accessories, consumables and controllers

EclipseXRM-900 - High Resolution X-ray Microscope

Computed TomographyComputed Tomography - Life SciX-ray Microscopy

Submicron resolution even at large working distances

Cathodyne - Optical Cathodoluminescence

A fast and sensitive optical CL imaging system that uses a plasma source and doesn't need a SEM to work.

TESCAN TENSOR - 4D STEM

TEM

A STEM that is as easy to use as a SEM

VGSTUDIO MAX

Computed Tomography

High-end software for the analysis and visualisation of CT data

TESCAN VEGA Compact

CLCLEMEBSDEDSIn situMicro XRFSEMWDS

Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.

METEOR

CLEMSEM

METEOR is the world’s first and only fully integrated solution to optimise the cryo-ET workflow by reducing complicated transfer steps and increasing sample yield

HRX-01 Digital Microscope

Digital Microscopy

Bringing digital microscopy to a completely new level

TESCAN SOLARIS X - Xe Plasma FIB-SEM for Semiconductors

EBSDEDSFabricationFIBMicroscopySEMTEMWDS

Xe plasma FIB-SEM for Semiconductors

AttoMap

Micro XRF

The Most Advanced XRF Microscope Assembled for a Homelab

SPARC

CLHyperspectralRamanSEM

SPARC: High-performance SEM cathodoluminescence detector

FF35 CT - Computed Tomography for Small and Medium Parts

Additive ManufacturingComputed TomographyX-ray ImagingX-ray Microscopy

High resolution industrial CT system for small/medium sized parts inspection

FF20 CT - MicroCT for Small Parts

Computed TomographyX-ray ImagingX-ray Microscopy

Ultimate automated semiconductor analysis

TESCAN DynaTOM

Computed TomographyIn situX-ray ImagingX-ray Microscopy

A dedicated 4D X-ray imaging

Model 1070 NanoClean

SEMTEM

Cleans specimens and holders immediately before insertion into an electron microscope; removes existing carbonaceous debris from the specimen and prevents contamination during imaging and analysis

TESCAN MIRA

CLCLEMEBSDEDSIn situMicro XRFSEMWDS

Versatile and powerful FEG SEM

TESCAN CoreTOM

Computed TomographyIn situX-ray ImagingX-ray Microscopy

Multiscale 3D core imaging

TESCAN UniTOM XL

Computed TomographyIn situX-ray ImagingX-ray Microscopy

A unique alternative in Dynamic 3D X-ray imaging for your lab

Model 1040 NanoMill

Diffraction ImagingFIBTEM

The NanoMill system is the ultimate companion for your FIB to optimise TEM specimen preparation quality

JOLT

CLEDSSEM

Panchromatic and RGB Cathodoluminescence (CL) detector

TESCAN VEGA

CLCLEMEBSDEDSIn situMicro XRFSEMWDS

Analytical SEM for materials science and life science applications in research and industry

TESCAN AMBER 2 - Ga FIB-SEM

EBSDEDSFabricationFIBIn situMicroscopySEMTEM

The most versatile and universal analytical Ga FIB-SEM platform on the market

TESCAN AMBER X 2 - Plasma FIB-SEM

EBSDEDSFabricationFIBIn situMicroscopySEMTEM

Combining the speed of a plasma FIB with the resolution of a Ga FIB

CORIOSITY

Automated MineralogyCore ScanningLIBS

High speed LIBS
High resolution geological core analysis for elemental maps and mineral images

TESCAN TIMA

Automated MineralogyEDSSEM

The TIMA is the most advanced Automated Mineralogy system

Cheetah EVO 2D/3D Inspection System for Small Components

Computed TomographyX-ray Imaging

The Cheetah EVO Plus includes new and improved features that make the system ready for the paradigm shift to a smart factory

Climate∞

In situTEM

Characterise your materials with sub-Angstrom resolution with dynamic studies featuring precise control over electrical, thermal and gas environments

Wildfire

In situTEM

Wildfire In situ TEM Heating

All
CL
Computed Tomography
EBSD
FIB
LIBS
Micro XRF
Tomographic Microscopy
WDS
X-ray Imaging
XRF

LIBS for increased lithium extraction efficiency from spodumene

LIBS

This whitepaper discusses the use cathodoluminescence of sedimentary rocks, specifically sandstone.

Examination of the Fluorine K Line with EDS and WDS

WDS

Quantitative WDS Analysis of a Contact Metamorphosed Calc-Silicate Rock

WDS

Spatial Resolution in WDS

WDS

Field Ion Emission in An Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light

Tomographic Microscopy

Computed TomographyTomographic MicroscopyX-ray Imaging

Cl imaging of Zircon

3D EBSD Static Method of 3DEBSD Analysis of Ti64

Static approach to 3D EDS and EBSD

EBSDFIB

Micro-Analysis and XRF Mapping on the ZSX Primus

Micro-Analysis and XRF Mapping
ZSX Primus

Micro XRFXRF

Microscopy & Microanalysis

ASA Nanoindenter - Micromechanical Testing System

EclipseXRM-900 - High Resolution X-ray Microscope

Cathodyne - Optical Cathodoluminescence

TESCAN TENSOR - 4D STEM

VGSTUDIO MAX

TESCAN VEGA Compact

METEOR

HRX-01 Digital Microscope

TESCAN SOLARIS X - Xe Plasma FIB-SEM for Semiconductors

AttoMap

SPARC

FF35 CT - Computed Tomography for Small and Medium Parts

FF20 CT - MicroCT for Small Parts

TESCAN DynaTOM

Model 1070 NanoClean

TESCAN MIRA

TESCAN CoreTOM

TESCAN UniTOM XL

Model 1040 NanoMill

JOLT

TESCAN VEGA

TESCAN AMBER 2 - Ga FIB-SEM

TESCAN AMBER X 2 - Plasma FIB-SEM

CORIOSITY

TESCAN TIMA

Cheetah EVO 2D/3D Inspection System for Small Components

Climate∞

Wildfire

Alemnis

SIGRAY

NewTec Scientific

TESCAN Group

Volume Graphics

Delmic

Hirox

Comet Yxlon

Fischione Instruments

ELEMISSION

DENSsolutions