Nanotechnology

Cutting edge instrumentation for both nano-fabrication and nano-characterisation

Field Ion Emission in An Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light

Biomaterials

The latest technology for research into advanced biomaterials

Field Ion Emission in An Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light

Fabrication

Advanced tools to assist researchers in nano-fabrication

Field Ion Emission in An Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light

Nano Materials

The latest technology for advancing research in nano-materials

Field Ion Emission in An Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light

Optics

The latest instruments for photonics research

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Our Nanotechnology Team

Kamran Khajepour
Materials and Nanotechnology Manager
Electron Microscopy, Raman Spectroscopy, Material Science, Nano Fabrication, Music Performance.
Peter Airey
Materials and Nanotechnology Specialist
With a background in materials chemistry, and an avid interest in science and technology, I am passionate about realising the potential for researchers to gain access to the latest technologies to furthur their understanding in Materials Science and Nanotechnology.
Jaret Lee
3D Printing and Additive Manufacturing Specialist
Trained as an electrical engineer, Jaret has a keen interest in nanotechnology and its applications. With 10 years of experience in equipment sales, he understands how cutting-edge instrumentation can enable researchers to do so much more – from performing more precise measurements to fabricating devices with unprecedented functionality.

Products

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Additive Manufacturing
AFM/SPM/SNOM
Bioprinting
Computed Tomography
Electron Microscopy
Extrustion Bioprinters
Fabrication
In situ
Micro XRF
Microscopy
Spectroscopy
Super Resolution Microscopy
Thermal Probe Lithography
X-ray absorption spectroscopy (XANES/EXAFS)

TESCAN TENSOR - 4D STEM

TESCAN TENSOR - 4D STEM

A STEM that is as easy to use as a SEM

CERES - Metal Additive Micromanufacturing

CERES - Metal Additive Micromanufacturing

Additive Manufacturing

Metal additive manufacturing at the micron-scale

microArch Industrial Micro Precision 3D Printers

microArch Industrial Micro Precision 3D Printers

Additive ManufacturingFabrication

Ultra-high resolution, accuracy and precision

LiteScope - AFM in Your SEM

LiteScope - AFM in Your SEM

AFM/SPM/SNOMElectron Microscopy

Correlative in situ AFM and SEM

NanoOne

NanoOne

Additive ManufacturingFabrication

NanoOne high throughput 3D printer with sub-micron resolution

SmartLab

SmartLab

The pinnacle instrument for X-ray materials analysis

Apollo

Apollo

Electron Microscopy

The world’s first event-based camera for high-throughput cryo-EM with no compromise in the QE and speed

TESCAN VEGA Compact

TESCAN VEGA Compact

Electron MicroscopyIn situMicro XRF

Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.

METEOR

METEOR

METEOR is the world’s first and only fully integrated solution to optimise the cryo-ET workflow by reducing complicated transfer steps and increasing sample yield

R-GEN 100 Multimodal Bioprinter

R-GEN 100 Multimodal Bioprinter

BioprintingExtrustion Bioprinters

The R GEN platform allows you to tailor your system to your specific requirements combining extrusion and light-based printing technologies.

R-GEN 200 3D Multimodal Bioprinting Station

R-GEN 200 3D Multimodal Bioprinting Station

BioprintingExtrustion Bioprinters

3D bioprinting station in a biosafety enclosure, bringing the future of tissue engineering and regenerative medicine closer.

Rigaku CT Lab HX

Rigaku CT Lab HX

Additive ManufacturingComputed Tomography

Benchtop ergonomics Computed Tomography for materials science

HRX-01 Digital Microscope

HRX-01 Digital Microscope

Bringing digital microscopy to a completely new level

TESCAN MAGNA

TESCAN MAGNA

Electron Microscopy

Ultimate UHR-SEM with TESCAN TriLens™ immersion optics technology

TESCAN CLARA

TESCAN CLARA

Electron Microscopy

The only UHR-SEM on the market that doesn’t discriminate between samples

TESCAN SOLARIS

TESCAN SOLARIS

Highest quality TEM lamellae preparation and superior analytical performance

TESCAN SOLARIS X - Xe Plasma FIB-SEM for Semiconductors

TESCAN SOLARIS X - Xe Plasma FIB-SEM for Semiconductors

Electron MicroscopyFabricationMicroscopy

Xe plasma FIB-SEM for Semiconductors

QuantumLeap XAS

QuantumLeap XAS

SpectroscopyX-ray absorption spectroscopy (XANES/EXAFS)

X-ray Absorption Spectroscopy (XAS)

XUUS4

XUUS4

SpectroscopyX-ray absorption spectroscopy (XANES/EXAFS)

A bench top source for EUV and soft X-rays

AttoMap

AttoMap

Micro XRF

The Most Advanced XRF Microscope Assembled for a Homelab

RAEA Amplifier

RAEA Amplifier

RAEA is KMLabs' sub-25 fs, single-box amplifier. It is a fully engineered and integrated commercial source based on a single rugged optomechanical platform with a unique software-tunable repetition rate in order to maximise experiment flexibility

SPARC

SPARC

Spectroscopy

SPARC: High-performance SEM cathodoluminescence detector

Eucentric Five Axis Table

Eucentric Five Axis Table

The E5AT stage is a five-axis positioning tool especially designed to allow tilting samples to ±90 deg while allowing unlimited rotation of the sample and keeping the area of interest at the eucentric position.

Cryo Module 80 Kelvin

Cryo Module 80 Kelvin

Electron MicroscopyIn situ

An extremely low vibration level cryo module that runs on liquid nitrogen, adding new capabilities to your SEM

Transfer Module

Transfer Module

Electron MicroscopyIn situ

Made for the purpose of carrying delicate and sensitive specimens in a capsule from the SEM into a glove box, or vice versa, to ensure they are protected from air or moisture at all times.

DE-64

DE-64

Electron Microscopy

Ideal for cryo-EM of very large viruses or cellular tomography. The DE-64 delivers user-adjustable full-frame streaming at up to 46 frames per second and offers unparalleled performance for electron counting.

DE-16

DE-16

Electron Microscopy

The DE-16 features the 10th generation of our revolutionary Direct Detection Device (DDD®) sensor, delivering industry-leading resolution and flexible, seamless viewing on a 4k x 4k field-of-view. The DE-16 is our most versatile direct detection TEM camera that enables TEM experiments not previously possible on a direct detector.

DE-DirectView

DE-DirectView

Electron Microscopy

Excellent upgrade option for your existing TEM offering low dose imaging, electron counting and 4D STEM

XRTmicron

XRTmicron

X-ray topography imaging system, for the non-destructive evaluation of single-crystalline materials.

TESCAN MIRA

TESCAN MIRA

Electron MicroscopyIn situMicro XRF

Versatile and powerful FEG SEM

Model 1040 NanoMill

Model 1040 NanoMill

Electron Microscopy

The NanoMill system is the ultimate companion for your FIB to optimise TEM specimen preparation quality

JOLT

JOLT

Panchromatic and RGB Cathodoluminescence (CL) detector

TESCAN VEGA

TESCAN VEGA

Electron MicroscopyIn situMicro XRF

Analytical SEM for materials science and life science applications in research and industry

TESCAN AMBER 2 - Ga FIB-SEM

TESCAN AMBER 2 - Ga FIB-SEM

Electron MicroscopyFabricationIn situMicroscopyThermal Probe Lithography

The most versatile and universal analytical Ga FIB-SEM platform on the market

TESCAN AMBER X 2 - Plasma FIB-SEM

TESCAN AMBER X 2 - Plasma FIB-SEM

Electron MicroscopyFabricationIn situMicroscopyThermal Probe Lithography

Combining the speed of a plasma FIB with the resolution of a Ga FIB

NANOPIX mini

NANOPIX mini

The world's first benchtop SAXS instrument

NANOPIX

NANOPIX

Synchrotron level SAXS performance at your fingertips

Ti:Sapphire Laser Oscillators

Ti:Sapphire Laser Oscillators

Ti:sapphire is the workhorse of ultrafast lasers due to its high gain bandwidth, enabling delivery of the shortest pulses and scalable to high pulse energy and average power. KMLabs provides a full suite of modelocked oscillators and integrated oscillator-amplifier systems, spanning pulse energies from the nJ range to 30 mJ in pulses from 15 to 40 fs.

MM3E Micromanipulator

MM3E Micromanipulator

Electron MicroscopyIn situ

Adding capabilities from in situ lift-out, electrical probing (FA)and nano-manipulation, the encoded MM3E micro-manipulator brings new functionality to your SEM or FIB/SEM instrument

Tensile/Compression Module

Tensile/Compression Module

In situ

World leading in situ materials testing of tensile and compression characteristics using your SEM

SuperFlat AFM

SuperFlat AFM

AFM/SPM/SNOMIn situ

The combination of Atomic Force Microscopy (AFM) and Scanning Electron Microscopes (SEM) opens the possibility of combining information on lateral dimensions and material from SEM inspection that can be readily complemented by precise topographical and force information in situ

Wildfire

Wildfire

In situ

Wildfire In situ TEM Heating

Lightning

Lightning

In situ

In Situ TEM Biasing & Heating
Sample Dynamics under controlled electrical and thermal environment.

Stream∞

Stream∞

In situ

STREAM; In Situ TEM Liquid, Liquid Biasing and Liquid Heating

NanoWorkstation

NanoWorkstation

In situ

The NanoWorkstation is a powerful, dedicated system that allows physical manipulation and characterisation at the micro and nano-scale with ease adding new capabilities to your SEM or FIB/SEM instrument.

NANORO M

NANORO M

MicroscopySuper Resolution Microscopy

Nanoro M- Super Resolution Optical Microscopy

ProbeWorkstation for Electrical Characterisation of Semiconductors

ProbeWorkstation for Electrical Characterisation of Semiconductors

In situ

The ProbeWorkstation is a powerful, dedicated system for electrical characterisation of semiconductor devices and advanced materials in SEM and FIB. The optimal combination of our market-leading nano-manipulation and probing products provide a versatile, integrated solution for failure analysis and R&D applications requiring stable, low-current measurements.