Analysis of Optical Fibres Using FIB-SEM and ToF-SIMS
Optical fibres are the backbone of high speed network communications. ToF-SIMS is the best way to measure chemical concentrations across the fibres.
UHV FIB-SEM NanoSpace
A specially designed platform combining UHV required applications such as MBE, ToF SIMS etc … with the resolution power of a SEM & FIB
TESCAN SOLARIS
Advanced nanofabrication system coupling UHR SEM column and best resolution Ga FIB column
Ga FIB TEM Sample Preparation from 10nm FinFET
Inspection of advanced materials and semiconductors at the nanoscale often involves TEM imaging, which in turn requires specialised sample preparation. In this application note we outline the procedure and demonstrate ...
TESCAN – Analysis of Flexible OLEDs
Active Matrix Organic Light Emitting Diodes (AMOLED) displays have become commonplace in smartphone displays. They have a back panel of thin film transistors that makes pixel control more accurate. Failure analysis ...
TESCAN SOLARIS X – Xe Plasma FIB-SEM for Semiconductors
An Xe Plasma FIB-SEM platform for deep sectioning and the highest resolution end-pointing for package level failure analysis.
Eucentric Five Axis Table
The E5AT stage is a five-axis positioning tool especially designed to allow tilting samples to ±90 deg while allowing unlimited rotation of the sample and keeping the area of interest ...
Model 1051 TEM Mill
Table top precision preparation for producing high quality TEM samples for a wide variety of applications
Model 1080 PicoMill
The FIB is highly effective in preparing TEM specimens, but the use of a high-energy, liquid metal ion source can often result in specimen amorphization, gallium implantation, or both. Let ...
Cryo Module 80 Kelvin
An extremely low vibration level cryo module that runs on liquid nitrogen, adding new capabilities to your SEM